Double-Sided Probing

Prober for wafer 12" 8" 6" /single die/packaged device/test fixture

EB DOUBLE-SIDED PROBER

This one is custom-made probe station.We can design DUT (device under test) be put
vertically or horizontally,OR one probe station can be switched between vertically and
horizontally.We are able to make the following measurement in one probe station

wafer 12" and less
Single Chip 350 microm x350 micron,
Test fixture 60x60 mm~150x150mm
Packaged Device
All the above measurement formats can be performed in one probe station.

RF & DC Measurement
We can design RF or DC measurement,OR one probe station can be used for
RF and DC measurement at the same time.

Low Current Measurement
The combination of the shielding box and triaxial tip holder can measured
the current level around 100fA

Vibration Free Table
This can isolate the vibration greatly from ground.