FIGURE 1

High impedance probes, PICOPROBER MODEL 18B and MODEL 19, combine the most advanced MOS and bipolar technologies with special, low capacitance packaging techniques to achieve truly remarkable electronic measurement capabilities. While being manufactured each instrument is individually optimized for the best possible performance. The extremely low input capacitance, high input impedance, and almost negligible input leakage current permits the direct probing of even the most sensitive MOS dynamic nodes. At the same time, the full dc capability of this Picoprobe coupled with the high speed capability permits the full characterization of even the fastest circuits.

The 10 micron tungsten probe wire is tapered to an extremely fine point to allow the probing of lines less than 0.3 micron. The fine probe wire flexes when in contact with the circuit, so that damage to the circuit and probe point is minimized. Also the flexing tends to keep the probe point in contact with the circuit even in the presence of probe table vibrations. Model 18B and Model 19 probe tips are also available with a 20 and 50 micron tungsten probe wire sharpened to less than 1 and 3 microns respectively.

The circuitry located in the Model 18B and Model19 PicoprobeR body is very rugged; however, the unprotected MOS input in each probe tip is subject to destruction by electrostatic discharge. Should the probe tip become damaged, it can easily be removed and replaced.