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Features |
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Coaxial-Driven Chuck Stage |
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RF Probing Field Upgradable |
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20X~4000X Magnification |
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Backlash-Free Movement |
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Platen Linear Quick Up/Down
Easy Load/Unload wafer |
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Platen Linear Fine Up/Down
Probe Card Tip Overdrive Adjustment |
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Specifications |
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Vacuum Chuck |
8" Stainless Steel |
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Chuck Stage |
8" x8" Travel |
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Chuck Theta |
0~30 degree |
Platen Up/Down
Coarse Adjustment |
6mm Adjustable
Lever-Driven |
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Platen Up/Down
Fine Adjustment |
25 mm Adjustable
Hand Wheel-Driven |
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Platen |
12 Micropositioner |
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Microscope Stage |
1" x1" Travel |
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|
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Requirements |
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Electrical |
110 VAC, 60Hz |
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Vacuum |
-250 mmHg, 7 liter/min |
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|
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Dimensions |
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780mmW x 660mmD x 700mmH With Microscope |
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Weight 80 Kg With Microscope |
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Accessories |
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Wafer Chuck Pull-out Stage |
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Miroscope Tilting Mechanism |
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RF Prone/Cables |
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Active Probes |
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Low Current/Capacitance Probes |
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High Voltage Probe |
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Laser Cutter |
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Ultrasonic Cutter |
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CCTV |
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Photomicrographics |
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Probe Card holder |
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Packaged Device Holder |
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PCB Holder |
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Thermal Systems |
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Liquid Crystal Kit |
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Vibration Free Table |
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Shielding Box |
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Test Bench |
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Instrument Case with Caster |
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Dark Field/Normarski Inspection |
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Chuck Vacuum Pattern |
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Gold Plated Chuck |
