News Update:

 

New Products:

Stress Station
Stress measurement of CMOS components
More info here


Liquid Crystal 29ºC
IC Failure Analysis Defect Detection

Nanopositioning for positioning resolution higher than micrometer-driven translation stage
How it works

Micropositoner with 200 threads per inch (TPI)
for positioning resolution up to 0.1 micron specifically for design house sub-micron probing

Microwave RF Probe Station at 6, 18, 26, 40, 50, 67, 110, 170, 220, and now at 325, all in GHz

Semiconductor DC needles on sale:
Tip dia. (in micron) of: 0.1, 0.4, 0.7, 1.0, 5.0, 10, 20, 25, 50, 100, 200, 300, 400, 500

Length: 1.26" (32 mm)
Shank Dia: 20 mil (500 u) Material: Tungsten, Berrylium Copper (BeCu)
Optional: Low profile bending of 45 degrees

Custom orders on request